[SOLVER Scanning Probe Microscope]

[Image] SFM image of silicon nitride cantilever on TGT01 test grating. 1.6x1.4 um scan size.

The conditions of the measurument
Date22-Aug-1996
DeviceSolver-P4 (16 bit DAC, scanning area 7um x 7um)
ModeSFM resonant mode
ProbeGold coated silicon nitride cantilever with curve radius 20nm.

Image courtesy of S.Nesterov, NT-MDT, Moscow, Russia.

Non published.


Copyright © 1996, NT-MDT
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