[NT-MDT: Molecular Devices and Tools for NanoTechnology]

Manuals for Scanning Probe Microscopy products

User's Guide At Solver-P4 Scanning Probe Microscope
Language OPIS_1_X.PDF (Acrobat Reader) Description fonts
   English OPIS_1_E.PDF (2580 Kb) TIMCYR.ZIP (192 Kb)
   Russian OPIS_1_R.PDF (2625 Kb)

User's Guide At Solver-P4 Microscope Control Program Description
Language OPIS_2_X.PDF (Acrobat Reader) Description fonts
   English OPIS_2_E.PDF (627 Kb) TIMCYR.ZIP (192 Kb)
   Russian OPIS_2_R.PDF (668 Kb)

User's Guide At Solver-P47 Scanning Probe Microscope
Language M47_1_XX.PDF (Acrobat Reader) Description fonts
   English M47_1_EN.PDF (5402 Kb) TMSDL.ZIP (103 Kb)
   Russian M47_1_RU.PDF (5522 Kb) TIMCYR.ZIP (192 Kb)

Silicon Gratings
*1. Introduction
*2. Data sheets
2.1 HOPG
2.2 TGZ
2.3 TGX01
2.4 TGG01
2.5 TGT
*3. Application notes
3.1 The Device Calibration
3.1.1 Z-axis Calibration
3.1.2 Õ-Ó-plane Calibration
3.2 Determination of scanning
nonlinearity
3.3 Determination the distortion of object
shape caused by CREEP-effect
3.4 Full 3-D image of the cantilever tip
observing, its curvature radius
measurement

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