NT-MDT

Scanning Probe Microscope, model Solver-P4

The Solver-P4 belongs to the third generation scanning probe microscopes. The device is designed for topographical investigations of surfaces physical properties and modification in various objects in air and liquid mediums. Viewing modes: atomic force microscopy mode, scanning tunneling mode, resonance mode, atomic force microscopy modulation mode. The modulation modes allow the oscillation amplitude and phase registration. In the a.m. modes it is possible to investigate the same surface area. The device is provided with a close field optical microscopy head equipped with a feedback loop to support the beamguide oscillation amplitude (Shear Force microscope).