Main technical specification Solver-P47

Solver, model Solver-P47H	Solver, model Solver-P47

Size of wafers		<40mm, thickness up to 10mm in the case of scanning by a sample and up to <110mm in the case of thickness of 15 mm.
Size of scanning area		50x50x4 um3
Word length used digital-to-analog converter for X, Y deflection		22
Transverse resonance scanner frequency		1 kHz
Longitudinal resonance scanner frequency		6 kHz
Range of measuring frequencies		0.01Hz - 2MHz
Range of operational frequencies in modes of a modulation and resonance microscopy		20kHz - 1.8MHz
Minimum step of the setting device of frequency and increments of frequency registrar		0.01Hz
Accuracy of phase measurements		0.1°
Increment of the setting device of phase shift between measuring signals		0.4°
Entering currents		10pA - 10nA with preamplifiers and 1pA - 1nA
Maximum amount of simultaneously noted and deduced on a screen, during scanning signals		4
Maximum number of points in lines and columns		1000
Feed		80 - 260 V, 40 - 70 Hz
Maximum deleting between a device and workstation		up to 300m
Environmental conditions:		temperature    25+/-15 °C humidity         80%