HIGHLIGHTS:

• Large scan area up to 100x100x5 um.
  
• Measuring modes:
  Scanning Tunneling Microscopy (STM);
  Low current STM;
  Atomic Force Microscopy (AFM);
  Lateral Force Microscopy (LFM);
  Magnetic Force Microscopy (MFM);
  Electrostatic Force Microscopy (EFM);
  Scanning Capacitance Microscopy (SCM);
  ResonantMode;
  Measuring Spreading Resistance;
  Phase Imaging.
  
• Lithography.
  
• Low vacuum chamber for measuring heads provides customer with:
  - easy and fast adjustment of the laser as the
    adjustment is carried out in a low vacuum;
  - the potential to work in an aggressive
    environment since the laser, and all electronics
    chips are located in low vacuum.
  
• Use of an antivibration table is not required.
  
• Feasible to process and modify the surface using standard UHV techniques (ion etching, heating, etc.) just before measurements, and then to retun the same area of the sample for further review.
  
• Optical registration of cantilever deflection (with the possibility to use piezo cantilevers).
  
• CCD camera to observe the sample and the tip.