NT-MDT Ultrasharp Silicon Cantilevers


		The package Ultrasharp Silicon Cantilevers Ultrasharp Silicon Cantilever Tests

General Ultrasharp silicon cantilever characteristics

All Ultrasharp silicon cantilevers:

- are compatible with of SPM devices;
- have standard sizes and thickness (0.45 mm) of cantilever
  chip;
- have AL high reflectivity coating (reflective property is
  increased by 2,5 times in comparison with uncoated
  cantilevers). You can choose cantilever without this
  coating;

All cantilever series are divided into two types: CONTACT and
NONCONTACT. The thickness of CONTACT cantilever spring
is 1.0 um and for NONCONTACT cantilever spring is 2.0 um.

All Ultrasharp silicon cantilever tips
have standard characteristics:

- high aspect ratio conical tips
  (cone angle is less than 20°);
- curvature radius of tip is less than
  10 nm (for uncoated tips);
- tip height 10-15 um;
- conductive lever and tip (resistivity
  less than 0.002 Om•cm).

SEM image of Ultrasharp silicon tip

SC11 and SC21 series with triangular springs

SC12 series with straight springs